Focused ION Beam Scanning Electron Microscope (FIB SEM) with Time-of-Flight Secondary ION Mass Spectrometry (TOF-SIMS)

CSIRO through this RFT is seeking responses from suitably qualified and experienced service providers for a new, second hand, demonstration or refurbished model of a focused ion beam scanning electron microscope (FIB SEM) with time-of-flight secondary ion mass spectrometer (TOFSIMS) for the principal purpose of supporting atom probe research within the "Advanced Resource Characterisation Facility".

The ability to undertake 3D Electron Backscattered Diffraction (EBSD) and 3D Energy dispersive X-ray spectroscopy (EDS) during ion beam milling of geological samples is essential and the TOFSIMS system must be suitable for the analysis of light element (H,C,O phases associated with hydrocarbons in fine grained sediments) during atom probe sample preparation. The integration of this system is essential and it must be fit for purpose and have a demonstrated market maturity, having been commercially available for >1yr.