Energy Technology X-Ray Diffractometer

The X-ray diffractometer will be capable of undertaking routine qualitative and quantitative powder diffraction, thin film analysis (including surface roughness, phase identification, layer thickness determination, analysis of polycrystalline and epitaxial layers) and characterisation of amorphous materials. The X-ray diffractometer instrument will be capable of undertaking:

• routine qualitative and quantitative powder diffraction;
• thin film analysis (including surface roughness, phase identification, layer thickness determination, analysis of polycrystalline and epitaxial layers);
• pole figure analysis of metal samples; and the

collection of high energy diffraction data for the analysis of amorphous materials such as catalysts using pair distribution function (PDF) methodology.