Scanning Electron Microscope (SEM)

The microscope will be used primarily for imaging of mineral grains in grain mounts and polished thin-sections, unconsolidated sediments, and microfossils, using backscattered electrons, secondary electrons, and cathodoluminescence.

The SEM will be housed within a purpose-built ion microprobe laboratory facility and maintained by experienced in-house staff.

The Supplier will be expected to provide a complete SEM fitted to the specifications described in this ATM.

The Goods, accessories, software and firmware that are necessary for continuous operations and full functionality, whether or not they are mentioned in this ATM, must be available from the Supplier and must be of current production. No demonstration, refurbished, prototype, discontinued or in development models will be accepted. If necessary, on request by Geoscience Australia, the Goods should be available for testing and evaluation, from the date of issue of this ATM.